Novi, Michigan, U.S.A. | April 30 – May 2, 2019
Date: Tuesday, April 30
Session 2: Discrete & Optoelectronic Technology Improvements
Presentation: Reliability Qualification of a 35 mohm 650V, 175C, GaN FET for Automotive Applications
Speaker: Ron Barr, VP of Quality + Reliability
Time: 1:30 – 2:00 p.m.
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