Georgia, U.S.A. | October 31 – November 2, 2018
Presentation: Reliability & Performance Related to Internal Avalanche of GaN Cascade Devices
Speakers: Yifeng Wu, VP of Product Development, Transphorm & Yan Lai, Platform Development Engineer, Nexperia
Presentation: High Voltage GaN Power Switch Reliability & Robustness
Speaker: Ron Barr, VP of Quality, Reliability and Analytics
For additional event information, visit here.