TransphormHighest Performance, Highest Reliability GaN

WiPDA 2019

North Carolina, U.S.A. | October 29 – October 31, 2019

Speaking Engagements/Presentations

Date: Tuesday, October 29
Tutorial: Best Practices Using Voltage Acceleration to Determine Device Reliability in High Voltage GaN
Speaker: Ron Barr, VP of Quality, Reliability and Analytics
Time: 2:20 p.m. – 3:40 p.m.

Date: Wednesday, October 30
Poster Session: High Voltage GaN Power Switch Reliability & Robustness
Authors: Feng Qi, Zhan Wang, Yifeng Wu
Time: 5:30 p.m. – 7:30 p.m.
GaN Applications
Poster Session: 900V GaN FETs in a 300 kHz 2 kW LLC for High Input Voltage Applications
Authors: Feng Qi, Zhan Wang, Yifeng Wu, Philip Zuk
Time: 5:30 p.m. – 7:30 p.m.
GaN Applications

For additional event information, visit here.

 

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