The TP65H480G4JSGB 650V 480mΩ Gallium Nitride (GaN) FET is a normally-off device built using Transphorm’s Gen IV platform. It combines state-of-the-art high voltage GaN HEMT and low voltage silicon MOSFET technologies—offering superior reliability and performance.
Transphorm GaN offers improved efficiency over silicon, through lower gate charge, lower crossover loss, and smaller reverse recovery charge.
The TP65H480G4JSGB is offered in an industry-standard PQFN56 with a common source package configuration.
Key Specifications |
VDSS (V) |
650 |
VDSS(TR) (V) |
800 |
RDS(on) (mΩ) max* |
480 |
Qrr (nC) typ |
15.2 |
Qg (nC) typ |
5 |
*Reflects both static and dynamic on-resistance |
Key Features
- Gen IV technology
- JEDEC qualified GaN technology
- Dynamic RDS(on)eff production tested
- Robust design, defined by
- Wide gate safety margin
- Transient over-voltage capability
- Very low QRR
- Reduced crossover loss
- RoHS-compliant and Halogen-free packaging
Key Benefits
- Achieves increased efficiency in both hard- and soft-switched circuits
- Increased power density
- Reduced system size and weight
- Overall lower system cost
- Easy to drive with commonly-used gate drivers
- GSD pin layout improves high speed design
AN0003: Printed Circuit Board Layout and Probing for GaN FETs
AN0007: PQFN88 and PQFN56 Lead-free 2nd Level Soldering Recommendations for Vapor Phase Reflow
AN0009: Recommended External Circuitry for Transphorm GaN FETs
AN0012: 5x6mm and 8x8mm PQFN Tape and Reel Information
DG001: LLC Resonant Tank Design for 3.3kW Electric Vehicle On-board Charger with Wide-range Output Voltage
DG004: Multi-pulse Testing for GaN Layout Verification | DG004 DSP Code
DG005: Ultrafast Overcurrent Breaker Circuit for Prototyping | DG005 Design Files
Evaluation Kits
Transphorm offers a number of GaN evaluation kits in various topologies, providing an easy-to-use platform to investigate the benefits of GaN.

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