The TP65H035G4WSQA 650V 35mΩ Gallium Nitride (GaN) FET is a normally-off device built using Transphorm’s GenIV platform. Using proprietary technology, resulting in reduced internal package inductance and a simplified assembly process. It combines a state-of-the-art high voltage GaN HEMT with a low voltage Silicon MOSFET to offer superior reliability and performance.
The device is also automotive qualified to 175C, having passed the Automotive Electronics Council’s AEC-Q101 stress tests for automotive-grade discrete semiconductors
Transphorm GaN offers improved efficiency over Silicon through lower gate charge, lower crossover loss, and smaller reverse recovery charge.
The TP65H035G4WSQA is offered in an industry-standard 3-lead TO-247 with a common source package configuration.
主な仕様 | |
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最小ドレイン電圧:VDSS (V) | 650 |
最大ドレイン・ソース間過渡電圧:VDSS(TR) (V) | 800 |
最大ドレイン・ソース間オン抵抗:RDS(on)eff (mΩ) max* | 41 |
逆回復電荷量代表値:QRR (nC) typ | 150 |
ゲートチャージ電荷量代表値:QG (nC) typ | 22 |
*Reflects both static and dynamic on-resistance |
主な特長
主な利点
Output Power (W)
Output Power (W)